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Abstract
Solution-based chemical method has been used to produce LiCo^sub 3/5^Mn^sub 1/5^Cu^sub 1/5^VO^sub 4^ ceramics. The formation of the compound is checked by X-ray diffraction analysis and it reveals an orthorhombic unit cell structure with lattice parameters of a = 9.8262 Å, b = 3.0706 Å, c = 14.0789 Å. Field emission scanning electron micrograph indicates a polycrystalline texture of the material with grains of unequal sizes (~0.2 to 3 μm). Complex impedance spectroscopy technique is used to study the dielectric properties. Temperature dependence of dielectric constant (ε ^sub r^) at various frequencies exhibits the dielectric anomalies in ε ^sub r^ at T ^sub c^ (transition temperature) = 245, 255, 260 and 265 °C with (ε^sub r^)^sub max.^ ~458, 311, 214 and 139 for 50, 100, 200 and 500 kHz, respectively. Frequency dependence of tangent loss at various temperatures shows the presence of dielectric relaxation in the material.[PUBLICATION ABSTRACT]