Complete bistatic (4 pi) polarimetric characterization of waves scattered from and across two-dimensional random rough surfaces using the full wave approach - ProQuest

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Complete bistatic (4 pi) polarimetric characterization of waves scattered from and across two-dimensional random rough surfaces using the full wave approach

Lee, Bom Son. The University of Nebraska - Lincoln ProQuest Dissertations & Theses, 1995. 9538640.