Document Preview Unavailable
Research of Mechanical Fault SVM Intelligent Recognition Based on EEMD Sample Entropy
Zhao, Jiali; Liu, Yuan; Lou, Junwei; Hu, Chibing. Sensors & Transducers Vol. 179, Iss. 9, (Sep 2014): 141-148.You might have access to this document
-
Try and log in through your institution to see if they have access to the full text.
Log in through your library