Identification of simulants for explosives using pixellated X-ray diffraction

Abstract

A new method of material identification has been developed utilising pixellated X-ray diffraction (PixD) to probe the molecular structure of hidden items. Since each material has a unique structure, this technique can be used to "fingerprint" items and has significant potential for use in security applications such as airport baggage scanning. The pixellated diffraction technique allows two distinct forms of diffraction, angular-dispersive and energy-dispersive X-ray diffraction, to be combined, exploiting the benefits of both. Thus, fast acquisition times are possible with a small system which contains no moving parts and can be easily implemented. In this work, the capability of the system to identify specific materials within a sample is highlighted. Such an approach would be highly beneficial for detecting explosive materials which are concealed amongst or inside other masking items. The technology could easily be added to existing baggage scanning equipment and would mean that if a suspicious item is seen in a regular X-ray image, the operator of the equipment could analyse the object in detail without opening the bag. The net result would be more accurate analysis of baggage content and faster throughput, as manual searching of suspicious objects would not be required.