Full text

Turn on search term navigation

The Author(s) 2013

Abstract

A single 210-nm Teflon nanoparticle (sTNP) was attached to the vertex of a silicon nitride (Si^sub 3^N^sub 4^) atomic force microscope tip and charged via contact electrification. The charged sTNP can then be considered a point charge and used to measure the electrostatic field adjacent to a parallel plate condenser using 30-nm gold/20-nm titanium as electrodes. This technique can provide a measurement resolution of 250/100 nm along the X- and Z-axes, and the minimum electrostatic force can be measured within 50 pN.

07.79.Lh, 81.16.-c, 84.37.+q

Details

Title
Direct measurement of electrostatic fields using single Teflon nanoparticle attached to AFM tip
Author
Chang, Joe-ming; Chang, Wei-yu; Chen, Fu-rong; Tseng, Fan-gang
Pages
1-7
Publication year
2013
Publication date
Dec 2013
Publisher
Springer Nature B.V.
ISSN
19317573
e-ISSN
1556276X
Source type
Scholarly Journal
Language of publication
English
ProQuest document ID
1652970874
Copyright
The Author(s) 2013