Abstract

In order to understand the physical properties of materials it is necessary to determine the 3D positions of all atoms. There has been significant progress towards this goal using electron tomography. However, this method requires a relatively high electron dose and often extended acquisition times which precludes the study of structural dynamics such as defect formation and evolution. In this work we describe a method that enables the determination of 3D atomic positions with high precision from single high resolution electron microscopic images of graphene that show dynamic processes. We have applied this to the study of electron beam induced defect coalescence and to long range rippling in graphene. The latter strongly influences the mechanical and electronic properties of this material that are important for possible future applications.

Details

Title
Snapshot 3D Electron Imaging of Structural Dynamics
Author
Liu-Gu, Chen 1 ; Warner, Jamie 2 ; Kirkland, Angus I 3 ; Fu-Rong, Chen 1 ; Dirk Van Dyck 4 

 National Tsing-Hua University, Department of Engineering and System Science, Hsin-Chu, Taiwan 
 University of Oxford, Department of Materials, Oxford, UK 
 University of Oxford, Department of Materials, Oxford, UK; Electron Physical Sciences Imaging Centre, Diamond Light Source Ltd, Harwell Science & Innovation Campus, Didcot, Oxfordshire, UK 
 University of Antwerp, EMAT, Department of Physics, Antwerp, Belgium 
Pages
1-7
Publication year
2017
Publication date
Sep 2017
Publisher
Nature Publishing Group
e-ISSN
20452322
Source type
Scholarly Journal
Language of publication
English
ProQuest document ID
1957750261
Copyright
© 2017. This work is published under http://creativecommons.org/licenses/by/4.0/ (the “License”). Notwithstanding the ProQuest Terms and Conditions, you may use this content in accordance with the terms of the License.