Abstract

Noise and decoherence due to spurious two-level systems located at material interfaces are long-standing issues for solid-state quantum devices. Efforts to mitigate the effects of two-level systems have been hampered by a lack of knowledge about their chemical and physical nature. Here, by combining dielectric loss, frequency noise and on-chip electron spin resonance measurements in superconducting resonators, we demonstrate that desorption of surface spins is accompanied by an almost tenfold reduction in the charge-induced frequency noise in the resonators. These measurements provide experimental evidence that simultaneously reveals the chemical signatures of adsorbed magnetic moments and highlights their role in generating charge noise in solid-state quantum devices.

Details

Title
Suppression of low-frequency charge noise in superconducting resonators by surface spin desorption
Author
de Graaf, S E 1   VIAFID ORCID Logo  ; Faoro, L 2 ; Burnett, J 3 ; Adamyan, A A 3 ; A Ya Tzalenchuk 4 ; Kubatkin, S E 3 ; Lindström, T 1 ; Danilov, A V 3 

 National Physical Laboratory, Teddington, UK 
 Laboratoire de Physique Theorique et Hautes Energies, CNRS UMR 7589, Universites Paris 6 et 7, Paris, France; L.D. Landau Institute for Theoretical Physics, Chernogolovka, Moscow Region, Russia 
 Department of Microtechnology and Nanoscience, Chalmers University of Technology, Göteborg, Sweden 
 National Physical Laboratory, Teddington, UK; Royal Holloway, University of London, Egham, UK 
Pages
1-6
Publication year
2018
Publication date
Mar 2018
Publisher
Nature Publishing Group
e-ISSN
20411723
Source type
Scholarly Journal
Language of publication
English
ProQuest document ID
2015811105
Copyright
© 2018. This work is published under http://creativecommons.org/licenses/by/4.0/ (the “License”). Notwithstanding the ProQuest Terms and Conditions, you may use this content in accordance with the terms of the License.