Abstract

In this paper, the preparation of Ni / SiO2 optical attenuator using two kinds of process, were discussed for electroless plating and magnetron sputtering technology, by analyzing Ni film appearance , surface morphology, film composition, SiO2 substrate and Ni film adhesion, known magnetron sputtering Ni film in all aspects of performance are better than electroless plating Ni film. Electroless plating Ni film quality not up to such requirements, can not be used in the practice. Conclusions: performance of Ni / SiO2 Optical Attenuator more practical and reliable by magnetron sputtering process preparing.

Details

Title
Compared to Performance of Ni / SiO2 Optical Attenuator by Two Preparing Methods
Author
Dong, Pengzhan; Tang, Hui; Li, Lei; Hao, Shanshan
Section
Chapter 4 Surface Engineering and Coating Technology
Publication year
2016
Publication date
2016
Publisher
EDP Sciences
ISSN
22747214
e-ISSN
2261236X
Source type
Conference Paper
Language of publication
English
ProQuest document ID
2057271249
Copyright
© 2016. This work is licensed under http://creativecommons.org/licenses/by/4.0/ (the “License”). Notwithstanding the ProQuest Terms and conditions, you may use this content in accordance with the terms of the License.