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Root Cause Analysis and Correction of Single Metal Contact Open-Induced Scan Chain Failure in 90nm node VLSI
Chao-Cheng, Ting; Ya-Chi, Liu; Chen, Hsuan-Hsien; Chung-Ching, Tsai; Shih, Liwen. arXiv.org, Jan 31, 2018.You might have access to this document
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