Abstract

The nucleation and propagation of dislocations is an ubiquitous process that accompanies the plastic deformation of materials. Consequently, following the first visualization of dislocations over 50 years ago with the advent of the first transmission electron microscopes, significant effort has been invested in tailoring material response through defect engineering and control. To accomplish this more effectively, the ability to identify and characterize defect structure and strain following external stimulus is vital. Here, using X-ray Bragg coherent diffraction imaging, we describe the first direct 3D X-ray imaging of the strain field surrounding a line defect within a grain of free-standing nanocrystalline material following tensile loading. By integrating the observed 3D structure into an atomistic model, we show that the measured strain field corresponds to a screw dislocation.

Details

Title
Three-dimensional X-ray diffraction imaging of dislocations in polycrystalline metals under tensile loading
Author
Cherukara, Mathew J 1   VIAFID ORCID Logo  ; Pokharel, Reeju 2   VIAFID ORCID Logo  ; Timothy S O’Leary 3 ; Baldwin, J Kevin 3 ; Maxey, Evan 4 ; Cha, Wonsuk 4   VIAFID ORCID Logo  ; Maser, Jorg 4 ; Harder, Ross J 4 ; Fensin, Saryu J 2 ; Sandberg, Richard L 3 

 Advanced Photon Source, Argonne National Laboratory, Argonne, IL, USA; Center for Nanoscale Materials, Argonne National Laboratory, Argonne, IL, USA 
 Materials Science and Technology Division, Los Alamos National Laboratory, Los Alamos, NM, USA 
 Laboratory for Ultrafast Materials and Optical Science, Center for Integrated Nanotechnologies, Los Alamos National Laboratory, Los Alamos, NM, USA 
 Advanced Photon Source, Argonne National Laboratory, Argonne, IL, USA 
Pages
1-6
Publication year
2018
Publication date
Sep 2018
Publisher
Nature Publishing Group
e-ISSN
20411723
Source type
Scholarly Journal
Language of publication
English
ProQuest document ID
2108222470
Copyright
© 2018. This work is published under http://creativecommons.org/licenses/by/4.0/ (the “License”). Notwithstanding the ProQuest Terms and Conditions, you may use this content in accordance with the terms of the License.