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The Exit-Wave Power-Cepstrum Transform for Scanning Nanobeam Electron Diffraction: Robust Strain Mapping at Subnanometer Resolution and Subpicometer Precision
Padgett, Elliot; Holtz, Megan E; Cueva, Paul; Yu-Tsun Shao; Langenberg, Eric; et al. arXiv.org, Oct 13, 2020.You might have access to this document
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