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Copyright © 2020 Seon Hee Kim et al. This is an open access article distributed under the Creative Commons Attribution License (the “License”), which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited. Notwithstanding the ProQuest Terms and Conditions, you may use this content in accordance with the terms of the License. http://creativecommons.org/licenses/by/4.0/

Abstract

Over the years, soft contact lenses for vision correction and cosmetic and therapeutic purposes have been greatly improved. For cosmetic contact lenses, the pigments need to be nontoxic, and the position of the pigment layer is particularly important because of the risks posed by pigment elution and the roughness of the lens surface. In this paper, we characterized the properties of brown cosmetic contact lenses made by three different manufacturers using surface analytical techniques. The surface topographies of the noncolored and colored parts were obtained by atomic force microscopy (AFM), and the position and composition of the pigment layer were determined by analyzing the cross section of the contact lenses using scanning electron microscopy with energy-dispersive X-ray spectroscopy (SEM-EDX). The influence of pigment location on surface roughness was also examined. In addition, to find the method of the evaluation for the risk of surface elution of the pigments in the colored parts, the mass spectra and ion images of the surfaces were obtained by time-of-flight secondary ion mass spectrometry (ToF-SIMS) with a new sample preparation. From the ToF-SIMS spectra, we observed specific fragment ions of the poly(hydroxyethyl methacrylate) (PHEMA) polymer and found differences in the composition of the pigment layer depending on the manufacturers. The cross-sectioned image and 3D chemical characterizations of metallic and specific ions in the brown cosmetic contact lenses clearly indicated the spatial distribution and location of the pigment layer that can be used for the evaluation of pigment elution.

Details

Title
ToF-SIMS and AFM Characterization of Brown Cosmetic Contact Lenses: From Structural Analysis to the Identification of Pigments
Author
Kim, Seon Hee 1   VIAFID ORCID Logo  ; Lee, Jihye 1   VIAFID ORCID Logo  ; Yun Jung Jang 2   VIAFID ORCID Logo  ; Kang-Bong, Lee 3   VIAFID ORCID Logo  ; Lee, Yeonhee 1   VIAFID ORCID Logo 

 Advanced Analysis Center, Korea Institute of Science & Technology, Seoul 02792, Republic of Korea 
 Advanced Analysis Center, Korea Institute of Science & Technology, Seoul 02792, Republic of Korea; Department of Materials Science and Engineering, Korea University, Seoul 02841, Republic of Korea 
 National Agenda Research Division, Korea Institute of Science & Technology, Seoul 02792, Republic of Korea 
Editor
Jose Vicente Ros-Lis
Publication year
2020
Publication date
2020
Publisher
John Wiley & Sons, Inc.
ISSN
20908865
e-ISSN
20908873
Source type
Scholarly Journal
Language of publication
English
ProQuest document ID
2350018928
Copyright
Copyright © 2020 Seon Hee Kim et al. This is an open access article distributed under the Creative Commons Attribution License (the “License”), which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited. Notwithstanding the ProQuest Terms and Conditions, you may use this content in accordance with the terms of the License. http://creativecommons.org/licenses/by/4.0/