Abstract

Liquid xenon particle detectors rely on excellent light collection efficiency for their performance. This depends on the high reflectivity of polytetrafluoroethylene (PTFE) at the xenon scintillation wavelength of 178 nm, but the angular dependence of this reflectivity is not well-understood. IBEX is designed to directly measure the angular distribution of xenon scintillation light reflected off PTFE in liquid xenon. These measurements are fully described by a microphysical reflectivity model with few free parameters. Dependence on PTFE type, surface finish, xenon pressure, and wavelength of incident light is explored. Total internal reflection is observed, which results in the dominance of specular over diffuse reflection and a reflectivity near 100% for high angles of incidence.

Details

Title
Measurements of angle-resolved reflectivity of PTFE in liquid xenon with IBEX
Author
Kravitz, S 1   VIAFID ORCID Logo  ; Smith, R J 2 ; Hagaman, L 2 ; Bernard, E P 2 ; McKinsey, D N 3 ; Rudd, L 2 ; Tvrznikova, L 4 ; Gann G D Orebi 3 ; Sakai, M 3 

1  Lawrence Berkeley National Laboratory, Berkeley, USA (GRID:grid.184769.5) (ISNI:0000 0001 2231 4551) 
2  University of California Berkeley, Department of Physics, Berkeley, USA (GRID:grid.47840.3f) (ISNI:0000 0001 2181 7878) 
3  Lawrence Berkeley National Laboratory, Berkeley, USA (GRID:grid.184769.5) (ISNI:0000 0001 2231 4551); University of California Berkeley, Department of Physics, Berkeley, USA (GRID:grid.47840.3f) (ISNI:0000 0001 2181 7878) 
4  Lawrence Berkeley National Laboratory, Berkeley, USA (GRID:grid.184769.5) (ISNI:0000 0001 2231 4551); University of California Berkeley, Department of Physics, Berkeley, USA (GRID:grid.47840.3f) (ISNI:0000 0001 2181 7878); Yale University, Department of Physics, New Haven, USA (GRID:grid.47100.32) (ISNI:0000000419368710); Lawrence Livermore National Laboratory, Livermore, USA (GRID:grid.250008.f) (ISNI:0000 0001 2160 9702) 
Publication year
2020
Publication date
Mar 2020
Publisher
Springer Nature B.V.
ISSN
14346044
e-ISSN
14346052
Source type
Scholarly Journal
Language of publication
English
DOI
https://doi.org/10.1140/epjc/s10052-020-7800-6
ProQuest document ID
2380538851
Copyright
The European Physical Journal C is a copyright of Springer, (2020). All Rights Reserved. This work is published under http://creativecommons.org/licenses/by/4.0/ (the “License”). Notwithstanding the ProQuest Terms and Conditions, you may use this content in accordance with the terms of the License.