Full Text

Turn on search term navigation

© 2020. This work is licensed under http://creativecommons.org/licenses/by/3.0/ (the “License”). Notwithstanding the ProQuest Terms and Conditions, you may use this content in accordance with the terms of the License.

Abstract

In this paper, a feature termed as the postpeak value is proposed for the pulsed eddy current technique (PECT). Moreover, a method using the postpeak value is proposed to classify surface and reverse defects. A PECT system is built for verification purposes. Experiment results prove that the postpeak feature value has better performance than that of the traditional peak value in the case of reverse defect detection. In contrast, the peak value is better than the postpeak value in the case of surface defect detection. Experiment results also validate that the proposed classification algorithm has advantages: classification can be achieved in real time, the calculation process and results are easy to understand, and supervised training is unnecessary.

Details

Title
Defect Classification Using Postpeak Value for Pulsed Eddy-Current Technique
Author
Ge, Jiuhao; Yang, Chenkai; Wang, Ping; Shi, Yongsheng
First page
3390
Publication year
2020
Publication date
2020
Publisher
MDPI AG
e-ISSN
14248220
Source type
Scholarly Journal
Language of publication
English
ProQuest document ID
2415064597
Copyright
© 2020. This work is licensed under http://creativecommons.org/licenses/by/3.0/ (the “License”). Notwithstanding the ProQuest Terms and Conditions, you may use this content in accordance with the terms of the License.