Abstract

For the first time, planar high-purity germanium detectors with thin amorphous germanium contacts were successfully operated directly in liquid nitrogen and liquid argon in a cryostat at the Max-Planck-Institut für Physics in Munich. The detectors were fabricated at the Lawrence Berkeley National Laboratory and the University of South Dakota, using crystals grown at the University of South Dakota. They survived long-distance transportation and multiple thermal cycles in both cryogenic liquids and showed reasonable leakage currents and spectroscopic performance. Also discussed are the pros and cons of using thin amorphous semiconductor materials as an alternative contact technology in large-scale germanium experiments searching for physics beyond the Standard Model.

Details

Title
Characterization of high-purity germanium detectors with amorphous germanium contacts in cryogenic liquids
Author
Panth, R 1 ; Liu, J 1   VIAFID ORCID Logo  ; Abt, I 2 ; Liu, X 2 ; Schulz, O 2 ; W-Z, Wei 1 ; Mei, H 1 ; D-M, Mei 1 ; G-J, Wang 1 

 University of South Dakota, Vermillion, USA (GRID:grid.267169.d) (ISNI:0000 0001 2293 1795) 
 Max-Planck-Institut für Physik, Munich, Germany (GRID:grid.435824.c) (ISNI:0000 0001 2375 0603) 
Publication year
2020
Publication date
Jul 2020
Publisher
Springer Nature B.V.
ISSN
14346044
e-ISSN
14346052
Source type
Scholarly Journal
Language of publication
English
ProQuest document ID
2426703726
Copyright
© The Author(s) 2020. This work is published under https://creativecommons.org/licenses/by/4.0/ (the “License”). Notwithstanding the ProQuest Terms and Conditions, you may use this content in accordance with the terms of the License.