Full Text

Turn on search term navigation

© 2020 by the authors. Licensee MDPI, Basel, Switzerland. This article is an open access article distributed under the terms and conditions of the Creative Commons Attribution (CC BY) license (http://creativecommons.org/licenses/by/4.0/). Notwithstanding the ProQuest Terms and Conditions, you may use this content in accordance with the terms of the License.

Abstract

Titanium alloy is widely used in the area of aerospace and aviation due to its excellent properties. Eddy current testing (ECT) is among the most extensively used non-destructive techniques for titanium alloy material inspection. However, most previous research has focused on inspecting defects far from the edge of the material. It is a challenging task for edge crack detection because of edge effect. This study aims to investigate the influences of sensor parameters on edge effect and defect detection capability, and in the meantime, optimize sensor parameters to improve the capability of edge defect detection. The simulation method for edge effect evaluation is proposed including the 2k factorial design used for factor screening, and the regression model is fitted and validated for sensor design and optimization for edge defect detection. A simulation scheme is designed to investigate the defect detection capability. An approach comprehensively analyzing the influence of coil parameters on edge effect and defect detection capability is applied to determine the optimal coil parameters for edge defect detection.

Details

Title
Edge Effect Analysis and Edge Defect Detection of Titanium Alloy Based on Eddy Current Testing
Author
Xie, Yuedong 1   VIAFID ORCID Logo  ; Li, Jiyao 2 ; Yang, Tao 3 ; Wang, Shupei 4 ; Yin, Wuliang 3   VIAFID ORCID Logo  ; Xu, Lijun 1   VIAFID ORCID Logo 

 School of Instrumentation and Optoelectronic Engineering, Beihang University, Beijing 100191, China; [email protected] (Y.X.); [email protected] (J.L.); Beijing Advanced Innovation Center for Big Data-Based Precision Medicine, Beihang University, Beijing 100191, China 
 School of Instrumentation and Optoelectronic Engineering, Beihang University, Beijing 100191, China; [email protected] (Y.X.); [email protected] (J.L.) 
 School of Electrical and Electronic Engineering, University of Manchester, Manchester M13 9PL, UK; [email protected] (Y.T.); [email protected] (W.Y.) 
 Manchester Advanced Intelligent Equipment Research and Innovation Centre Ltd. (MAIERIC Ltd.), Manchester M13 9PL, UK; [email protected] 
First page
8796
Publication year
2020
Publication date
2020
Publisher
MDPI AG
e-ISSN
20763417
Source type
Scholarly Journal
Language of publication
English
ProQuest document ID
2469883316
Copyright
© 2020 by the authors. Licensee MDPI, Basel, Switzerland. This article is an open access article distributed under the terms and conditions of the Creative Commons Attribution (CC BY) license (http://creativecommons.org/licenses/by/4.0/). Notwithstanding the ProQuest Terms and Conditions, you may use this content in accordance with the terms of the License.