It appears you don't have support to open PDFs in this web browser. To view this file, Open with your PDF reader
Abstract
A poly(methyl methacrylate) (PMMA) substrate is easily soluble in acetone and cannot withstand high temperatures, thereby restricting the application of graphene or boron nitride (BN) on it. Furthermore, the assembly mechanism of a BN/graphene/BN heterostructure directly determines the performance of a device. In this paper, we report the single-spin photoresist stacking transfer assembly (SPSTA) of a BN/graphene/BN heterostructure on a PMMA substrate using a photoresist as a support layer. The photoresist served as a protective layer for the retained BN/graphene/BN heterostructure. The excess BN/graphene/BN heterostructure was etched away by oxygen plasma, following which a metal was evaporated on the photoresist surface. As metal is impervious to light, the excellent light transmittance of the PMMA substrate could be utilized. After the photoresist was denatured by ultraviolet light exposure on the back of the substrate, it was dissolved by a sodium hydroxide (NaOH) solution, and a one-dimensional contact of the BN/graphene/BN heterostructure and metal was achieved. Finally, through different testing methods, we found that the SPSTA of the BN/graphene/BN heterostructure yields a smooth morphology and high electrical conductivity with a uniform sheet resistance. We examined the air failure of the BN/graphene/BN heterostructure and found that its SPSTA was stable. Our study realized the transfer of two-dimensional (2D) materials on PMMA substrates for the first time, overcame the membrane surface pollution caused by the traditional BN/graphene/BN heterostructure assembly process, realized the fabrication of BN/graphene/BN heterostructure devices on PMMA substrates for the first time, and offers important insights for the application of graphene and BN or other 2D materials on PMMA substrates.
You have requested "on-the-fly" machine translation of selected content from our databases. This functionality is provided solely for your convenience and is in no way intended to replace human translation. Show full disclaimer
Neither ProQuest nor its licensors make any representations or warranties with respect to the translations. The translations are automatically generated "AS IS" and "AS AVAILABLE" and are not retained in our systems. PROQUEST AND ITS LICENSORS SPECIFICALLY DISCLAIM ANY AND ALL EXPRESS OR IMPLIED WARRANTIES, INCLUDING WITHOUT LIMITATION, ANY WARRANTIES FOR AVAILABILITY, ACCURACY, TIMELINESS, COMPLETENESS, NON-INFRINGMENT, MERCHANTABILITY OR FITNESS FOR A PARTICULAR PURPOSE. Your use of the translations is subject to all use restrictions contained in your Electronic Products License Agreement and by using the translation functionality you agree to forgo any and all claims against ProQuest or its licensors for your use of the translation functionality and any output derived there from. Hide full disclaimer
Details

1 School of Mechanical and Electrical Engineering, Xi’an University of Architecture and Technology, Xi’an 710055, People’s Republic of China; Shaanxi Key Laboratory of Nano Materials and Technology, Xi’an 710055, People’s Republic of China
2 The State Key Laboratory for Mechanical Manufacturing System Engineering, Xi’an Jiaotong University, Xi’an 710049, People’s Republic of China