Full Text

Turn on search term navigation

© 2020 by the authors. Licensee MDPI, Basel, Switzerland. This article is an open access article distributed under the terms and conditions of the Creative Commons Attribution (CC BY) license (http://creativecommons.org/licenses/by/4.0/). Notwithstanding the ProQuest Terms and Conditions, you may use this content in accordance with the terms of the License.

Abstract

An inductive debris sensor can monitor a mechanical system’s debris in real time. The measuring accuracy is significantly affected by the signal aliasing issue happening in the monitoring process. In this study, a mathematical model was built to explain two debris particles’ aliasing behavior. Then, a cross-correlation-based method was proposed to deal with this aliasing. Afterwards, taking advantage of the processed signal along with the original signal, an optimization strategy was proposed to make the evaluation of the aliasing debris more accurate than that merely using initial signals. Compared to other methods, the proposed method has fewer limitations in practical applications. The simulation and experimental results also verified the advantage of the proposed method.

Details

Title
Cross-Correlation Algorithm-Based Optimization of Aliasing Signals for Inductive Debris Sensors
Author
Wang, Xingjian 1   VIAFID ORCID Logo  ; Sun, Hanyu 2   VIAFID ORCID Logo  ; Wang, Shaoping 1 ; Huang, Wenhao 3 

 School of Automation Science and Electrical Engineering, Beihang University, Beijing 100191, China; [email protected] (H.S.); [email protected] (S.W.); [email protected] (W.H.); Beijing Advanced Innovation Center for Big Data-based Precision Medicine, Beihang University, Beijing 100191, China; Ningbo Institute of Technology, Beihang University, Ningbo 315800, China; Science and Technology on Aircraft Control Laboratory, Beihang University, Beijing 100191, China 
 School of Automation Science and Electrical Engineering, Beihang University, Beijing 100191, China; [email protected] (H.S.); [email protected] (S.W.); [email protected] (W.H.); Shenzhen Institutes of Advanced Technology, Chinese Academy of Sciences, Shenzhen 518055, China 
 School of Automation Science and Electrical Engineering, Beihang University, Beijing 100191, China; [email protected] (H.S.); [email protected] (S.W.); [email protected] (W.H.) 
First page
5949
Publication year
2020
Publication date
2020
Publisher
MDPI AG
e-ISSN
14248220
Source type
Scholarly Journal
Language of publication
English
ProQuest document ID
2550312935
Copyright
© 2020 by the authors. Licensee MDPI, Basel, Switzerland. This article is an open access article distributed under the terms and conditions of the Creative Commons Attribution (CC BY) license (http://creativecommons.org/licenses/by/4.0/). Notwithstanding the ProQuest Terms and Conditions, you may use this content in accordance with the terms of the License.