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Abstract
We demonstrate single-shot temporal characterization of relativistic electron bunches using single-cycle terahertz (THz) field streaking. A transverse deflecting structure consisting of a metal slit enables efficient coupling of the THz field and electron bunch. The intrinsically stable carrier envelope phase and strong gradient of the THz pulses allow simultaneous, self-calibrated determination of the time-of-arrival with subfemtosecond precision and bunch duration with single-femtosecond precision, respectively, opening up new opportunities for ultrafast electron diffraction as well as accelerator technologies in general.
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