Abstract

We demonstrate single-shot temporal characterization of relativistic electron bunches using single-cycle terahertz (THz) field streaking. A transverse deflecting structure consisting of a metal slit enables efficient coupling of the THz field and electron bunch. The intrinsically stable carrier envelope phase and strong gradient of the THz pulses allow simultaneous, self-calibrated determination of the time-of-arrival with subfemtosecond precision and bunch duration with single-femtosecond precision, respectively, opening up new opportunities for ultrafast electron diffraction as well as accelerator technologies in general.

Details

Title
Terahertz-based subfemtosecond metrology of relativistic electron beams
Author
Li, R K; Hoffmann, M C; Nanni, E A; Glenzer, S H; Kozina, M E; Lindenberg, A M; Ofori-Okai, B K; Reid, A H; Shen, X; Weathersby, S P; Yang, J; Zajac, M; Wang, X J
Section
ARTICLES
Publication year
2019
Publication date
Jan 2019
Publisher
American Physical Society
e-ISSN
24699888
Source type
Scholarly Journal
Language of publication
English
ProQuest document ID
2551571336
Copyright
© 2019. This work is licensed under https://creativecommons.org/licenses/by/4.0/ (the “License”). Notwithstanding the ProQuest Terms and Conditions, you may use this content in accordance with the terms of the License.