Abstract

The past decade has seen rapid advances in direct detector technology for electron microscopy. Direct detectors are now having an impact on a number of techniques in transmission electron microscopy (TEM), scanning electron microscopy, and scanning TEM (STEM), including single particle cryogenic electron microscopy, in situ TEM, electron backscatter diffraction, four-dimensional STEM, and electron energy loss spectroscopy. This article is intended to serve as an introduction to direct detector technology and an overview of the range of electron microscopy techniques that direct detectors are now being applied to.

Details

Title
Direct detectors and their applications in electron microscopy for materials science
Author
Levin, Barnaby D A 1   VIAFID ORCID Logo 

1  Direct Electron L.P., San Diego, CA, United States of America 
Publication year
2021
Publication date
Oct 2021
Publisher
IOP Publishing
e-ISSN
25157639
Source type
Scholarly Journal
Language of publication
English
DOI
https://doi.org/10.1088/2515-7639/ac0ff9
ProQuest document ID
2555395294
Copyright
© 2021. This work is published under http://creativecommons.org/licenses/by/4.0 (the “License”). Notwithstanding the ProQuest Terms and Conditions, you may use this content in accordance with the terms of the License.