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a-SiCxNy thin films deposited by a microwave plasma assisted CVD process using a CH4/N2/Ar/HMDSN mixture: Methane rate effect
Bulou, S; L Le Brizoual; Miska, P; de Poucques, L; Hugon, R
; et al.
IOP Conference Series. Materials Science and Engineering; Bristol Vol. 12, Iss. 1, (Jul 2010).
DOI:10.1088/1757-899X/12/1/012002
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