Abstract

In the present study, a new method for analyzing the dielectric functions in dependence with the thickness of ultra-thin gold films is proposed. The reliability of the method is carefully verified through the correlation of optical properties and structural morphology of gold films at thicknesses around the percolation threshold (from 2 to 20 nm). The optical characterization of deposited films is performed in visible and NIR regions (300-1500 nm) by a spectroscopic ellipsometry along with transmission spectra measurements at normal incidence. Fitting of the ellipsometric data allows one to calculate the effective complex dielectric function of cluster-like and continuous films of different mass-equivalent thickness. Surface morphology of the films is analysed by scanning electron microscopy.

Details

Title
Morphology and effective dielectric functions of ultra-thin gold films
Author
Yakubovsky, D I 1 ; Kirtaev, R V 1 ; Stebunov, Y S 2 ; Arsenin, A V 2 ; Volkov, V S 3 

 Moscow Institute of Physics and Technology, Institutskyi 9, 141700, Dolgoprudnyi, Russia 
 Moscow Institute of Physics and Technology, Institutskyi 9, 141700, Dolgoprudnyi, Russia; GrapheneTek, 7 Nobel Street, Skolkovo Innovation Center, 143026, Russia 
 Moscow Institute of Physics and Technology, Institutskyi 9, 141700, Dolgoprudnyi, Russia; GrapheneTek, 7 Nobel Street, Skolkovo Innovation Center, 143026, Russia; SDU Nano Optics, Mads Clausen Institute, University of Southern Denmark, Campusvej 55, DK-5230, Odense, Denmark 
Publication year
2018
Publication date
Sep 2018
Publisher
IOP Publishing
ISSN
17426588
e-ISSN
17426596
Source type
Scholarly Journal
Language of publication
English
ProQuest document ID
2565705662
Copyright
© 2018. This work is published under http://creativecommons.org/licenses/by/3.0/ (the “License”). Notwithstanding the ProQuest Terms and Conditions, you may use this content in accordance with the terms of the License.