Abstract

Modelling n-p-junction is an urgent task, because theoretical models do not describe all the properties of semiconductor structures with different content of impurities. The influence of impurities on the properties of asymmetric n-p-junction was analyzed in the paper. The Poisson equation in the space charge region (SCR) of the equilibrium n-p-junction was solved numerically. The charge density in the SCR was also calculated. It has been shown that the structure of SCR of strongly asymmetric n-p-junction substantially differs from the model of depleted charge carriers, and includes four parts: 1 – highly doped region, wherein the main charge carriers partially compensate the charge of the ionized impurities; 2 – low-doped region containing ionized impurities of the opposite sign with respect to the first, enriched with charge carriers, increasing the charge of ionized impurities; 3 – lowly doped region, wherein the concentrations of electrons and holes much less than the concentration of ionized impurities; 4 – lowly doped region, wherein the main charge carriers partially compensate the charge of the ionized impurities.

Details

Title
Modelling of asymmetric n-p junction enriched with charge carriers in equilibrium state
Author
Bogatov, N M 1 ; Grigoryan, L R 1 ; Kovalenko, A I 1 ; Nesterenko, I I 1 ; Polovodov, Y A 1 

 Department of Physics and Information Systems, Kuban State University, 149 Stavropolskaya Street, 350040 Krasnodar, Russian Federation 
Publication year
2019
Publication date
Jul 2019
Publisher
IOP Publishing
ISSN
17426588
e-ISSN
17426596
Source type
Scholarly Journal
Language of publication
English
ProQuest document ID
2567779950
Copyright
© 2019. This work is published under http://creativecommons.org/licenses/by/3.0/ (the “License”). Notwithstanding the ProQuest Terms and Conditions, you may use this content in accordance with the terms of the License.