Development and Application of a New Type of X-ray Fluorescence Online Grade Analyzer Based on STM32

Abstract

In order to achieve more accurate measurement of the pulp element grade in the beneficiation process, a new generation of nuclear-free X-ray fluorescence online grade analyzer was developed based on the previous generation of nuclear online grade analyzer. This new X-ray fluorescence grade analyzer is developed based on the STM32F407 control chip. It adopts a measurement structure that combines X high voltage light tube and semiconductor detector. Its technical structure and analysis principle are: X-ray tube and semiconductor detector constitute a measurement unit. The X-rays excited by the X-ray tube are irradiated to the surface of the slurry to be measured, and the semiconductor detector receives X-characteristic fluorescence excited by the element to be measured in the slurry. The main control unit receives and processes the data signals uploaded by the semiconductor detector. Send the measured element count rate to the upper computer of the industrial computer through serial communication. Finally, the higher-level software calls Matlab mathematical analysis tool while using BP neural network to perform data modeling analysis and obtain the grade value. According to a field industrial test conducted at a ore dressing plant in Shaoxing, compared with the previous generation nuclear grade analyzer, the measurement accuracy and operating stability of the new X-ray online grade analyzer have been significantly improved, and various parameters All met the design requirements for development.