Abstract

In this paper, we have studied the fractal microstructures that form within conducting layers of oxide compositions and the effects that happen during electrical breakdown. We have determined that application of additional polymer films on top of the layers of oxide compositions allows one to visualize the breakdown processes taking place in the structure. The enlarged "polymer photography" that results in this makes it possible to assess the quality of contact layers without using high-resolution optical equipment.

Details

Title
Formation of fractal microstructures in conductive layers of indium-tin oxides and zinc oxide
Author
Bobkov, A A 1 ; Borodzulya, V F 2 ; Solomonov, A V 1 ; Mikhailov, I I 1 ; Moshnikov, V A 1 ; Tarasov, S A 1 ; Lamkin, I A 1 ; Lebedeva, T D 1 

 Saint Petersburg Electrotechnical University «LETI» (ETU 
 Peter the Great St.Petersburg Polytechnic University 
Publication year
2018
Publication date
Jun 2018
Publisher
IOP Publishing
ISSN
17426588
e-ISSN
17426596
Source type
Scholarly Journal
Language of publication
English
ProQuest document ID
2572332504
Copyright
© 2018. This work is published under http://creativecommons.org/licenses/by/3.0/ (the “License”). Notwithstanding the ProQuest Terms and Conditions, you may use this content in accordance with the terms of the License.