Abstract

In this paper a probe of an atomic force microscope (AFM) served as a detector of optical radiation. We investigated absorption of optical radiation in the visible range by commercially available Si and Si3N4 probes. It has been shown that the radiation in the far field is mainly absorbed in the probe tip. By scanning a laser beam with a diameter of ∼ 0.7 microns by the AFM probe, a lateral resolution of ∼ 1.5 microns was demonstrated. Numerical modeling of evanescent wave absorption by AFM probes showed enhancement of the absorption in the probes as compared with a flat surface. A Si3N4 probe more effectively absorbs the evanescent radiation.

Details

Title
Light absorption by an atomic force microscope probe
Author
Sharov, V A 1 ; Dunaevskiy, M S 2 ; Kryzhanovskaya, N V 3 ; Polubavkina, Yu S 3 ; Alekseev, P A 1 

 Ioffe Institute, 26 Politekhnicheskaya str., St. Petersburg 194021, Russia 
 Ioffe Institute, 26 Politekhnicheskaya str., St. Petersburg 194021, Russia; ITMO University, 49 Kronverksky pr., St. Petersburg 197101, Russia 
 Saint Petersburg National Research Academic University of RAS, 8 Khlopina str., St. Petersburg 194021, Russia 
Publication year
2017
Publication date
Mar 2017
Publisher
IOP Publishing
ISSN
17426588
e-ISSN
17426596
Source type
Scholarly Journal
Language of publication
English
ProQuest document ID
2573874673
Copyright
© 2017. This work is published under http://creativecommons.org/licenses/by/3.0/ (the “License”). Notwithstanding the ProQuest Terms and Conditions, you may use this content in accordance with the terms of the License.