Abstract

Adaptive behavior of resistive state in response to electrical stimulation has been studied for the silicon oxide based memristive nanostructures subjected to electroforming in the conditions of current compliance. The limitation of current and temperature during electroforming affects the parameters of growing conductive filaments and reduction-oxidation reactions resulting in a higher dynamic range of gradual resistance change important for neuromorphic applications.

Details

Title
Effect of current limitation on the adaptive behavior of memristive nanostructures
Author
Korolev, D S 1 ; Mikhaylov, A N 1 ; Belov, A I 1 ; Okulich, E V 1 ; Antonov, I N 1 ; Gorshkov, O N 1 ; Tetelbaum, D I 1 

 Lobachevsky University, 23/3 Gagarin prospect, Nizhny Novgorod, 603950, Russia 
Publication year
2017
Publication date
Nov 2017
Publisher
IOP Publishing
ISSN
17426588
e-ISSN
17426596
Source type
Scholarly Journal
Language of publication
English
ProQuest document ID
2574471561
Copyright
© 2017. This work is published under http://creativecommons.org/licenses/by/3.0/ (the “License”). Notwithstanding the ProQuest Terms and Conditions, you may use this content in accordance with the terms of the License.