Abstract

Fabrication and study of specialized single nanowhisker probes are performed for high-precision investigation of elements such as nanospheres and nanorods using the atomic force microscopy. It was found that single nanowhisker probe significantly increases the resolution and contrast of images obtained in the semi-contact mode. Furthermore, the roughness analysis and adhesion forces are investigated in contact mode to comprehensively characterize properties of nanospherical and nanorod electronic structures.

Details

Title
High-precision investigation of nanorod and nanosphere topological structures for nanoelectronic issues by means of atomic-force microscopy
Author
Zhukov, M V 1 ; Lysak, V V 2 ; Mukhin, I S 3 ; Golubok, A O 1 

 Department of material science and nanotechnology, ITMO University, 197101 Kronverkskiy pr., 49, Saint-Petersburg, Russian Federation; Department of scanning probe microscopy and spectroscopy, Institute for Analytical Instrumentation RAS, 198095 Ivan Chernykh, 31-33, Saint-Petersburg, Russian Federation 
 Department of material science and nanotechnology, ITMO University, 197101 Kronverkskiy pr., 49, Saint-Petersburg, Russian Federation 
 Department of material science and nanotechnology, ITMO University, 197101 Kronverkskiy pr., 49, Saint-Petersburg, Russian Federation; Laboratory of renewable energy source, St Petersburg Academic University RAS, 194021 Khlopina, 8/3, Saint-Petersburg, Russian Federation 
Publication year
2016
Publication date
Aug 2016
Publisher
IOP Publishing
ISSN
17426588
e-ISSN
17426596
Source type
Scholarly Journal
Language of publication
English
ProQuest document ID
2575184666
Copyright
© 2016. This work is published under http://creativecommons.org/licenses/by/3.0/ (the “License”). Notwithstanding the ProQuest Terms and Conditions, you may use this content in accordance with the terms of the License.