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Abstract
In order to perform positron lifetime measurements on thin films under atmospheric conditions, a slow positron microbeam was extracted into air using silicon nitride thin films (30 nm and 200 nm) as a vacuum window. Even the thinner window (30 nm) was found to reliably withstand a differential pressure of 1 atm under various stress tests. By placing the sample in an enclosed chamber through which gas with a fixed, controllable relative humidity (RH) was continuously passed, the RH dependence of the ortho-positronium lifetime for bulk fused silica was examined.
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Details
1 Research Institute of Instrumentation Frontier (RIIF), National Institute of Advanced Industrial Science and Technology (AIST), Tsukuba, Ibaraki 305-8568, Japan; To whom any correspondence should be addressed
2 Research Institute of Instrumentation Frontier (RIIF), National Institute of Advanced Industrial Science and Technology (AIST), Tsukuba, Ibaraki 305-8568, Japan
3 Metrology Institute of Japan (MIJ), National Institute of Advanced Industrial Science and Technology (AIST), Tsukuba, Ibaraki 305-8565, Japan
4 Research Institute for Innovation in Sustainable Chemistry (ISC), National Institute of Advanced Industrial Science and Technology (AIST), Tsukuba, Ibaraki 305-8565, Japan
5 Division of Applied Physics, Faculty of Pure and Applied Science, University of Tsukuba, Tsukuba, Ibaraki 305-8573, Japan
6 Research Laboratory for Nuclear Reactors, Tokyo Institute of Technology, Meguro, Tokyo 152-8550, Japan