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Characterization of U-based thin films: the UFe2+x case
Kim-Ngan, Nhu-T H; Havela, L; Adamska, A M; Daniš, S; Pešička, J
; et al.
Journal of Physics: Conference Series; Bristol Vol. 303, Iss. 1, (Jul 2011).
DOI:10.1088/1742-6596/303/1/012012
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