- Preview Available
- Scholarly Journal
Temperature dependence of capacitance of Si quantum dot floating gate MOS capacitor
Sakurai, Y; Nomura, S; Shiraishi, K; Ikeda, M; Makihara, K
; et al.
Journal of Physics: Conference Series; Bristol Vol. 150, Iss. 2, (Feb 2009).
DOI:10.1088/1742-6596/150/2/022071
This is a limited preview of the full PDF
Try and log in through your library or institution to see if they have access.