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© 2021 by the authors. Licensee MDPI, Basel, Switzerland. This article is an open access article distributed under the terms and conditions of the Creative Commons Attribution (CC BY) license (https://creativecommons.org/licenses/by/4.0/). Notwithstanding the ProQuest Terms and Conditions, you may use this content in accordance with the terms of the License.

Abstract

The morphology of nanoparticles governs their properties for a range of important applications. Thus, the ability to statistically correlate this key particle performance parameter is paramount in achieving accurate control of nanoparticle properties. Among several effective techniques for morphological characterization of nanoparticles, transmission electron microscopy (TEM) can provide a direct, accurate characterization of the details of nanoparticle structures and morphology at atomic resolution. However, manually analyzing a large number of TEM images is laborious. In this work, we demonstrate an efficient, robust and highly automated unsupervised machine learning method for the metrology of nanoparticle systems based on TEM images. Our method not only can achieve statistically significant analysis, but it is also robust against variable image quality, imaging modalities, and particle dispersions. The ability to efficiently gain statistically significant particle metrology is critical in advancing precise particle synthesis and accurate property control.

Details

Title
Statistically Representative Metrology of Nanoparticles via Unsupervised Machine Learning of TEM Images
Author
Wen, Haotian 1   VIAFID ORCID Logo  ; Luna-Romera, José María 2   VIAFID ORCID Logo  ; Riquelme, José C 2   VIAFID ORCID Logo  ; Dwyer, Christian 3 ; Chang, Shery L Y 4 

 School of Materials Science and Engineering, University of New South Wales, Sydney, NSW 2052, Australia 
 Software and Computing Systems, Universidad de Sevilla, 41004 Seville, Spain; [email protected] (J.M.L.-R.); [email protected] (J.C.R.) 
 Electron Imaging and Spectroscopy Tools, Sydney, NSW 2219, Australia; [email protected] 
 School of Materials Science and Engineering, University of New South Wales, Sydney, NSW 2052, Australia; Mark Wainwright Analytical Centre, Electron Microscope Unit, University of New South Wales, Sydney, NSW 2052, Australia 
First page
2706
Publication year
2021
Publication date
2021
Publisher
MDPI AG
e-ISSN
20794991
Source type
Scholarly Journal
Language of publication
English
ProQuest document ID
2584466929
Copyright
© 2021 by the authors. Licensee MDPI, Basel, Switzerland. This article is an open access article distributed under the terms and conditions of the Creative Commons Attribution (CC BY) license (https://creativecommons.org/licenses/by/4.0/). Notwithstanding the ProQuest Terms and Conditions, you may use this content in accordance with the terms of the License.