It appears you don't have support to open PDFs in this web browser. To view this file, Open with your PDF reader
Abstract
Transition metal alloys are essential for magnetic recording, memory, and new materials-by-design applications. Saturation magnetization in these alloys have previously been measured by conventional techniques, for a limited number of samples with discrete compositions, a laborious and time-consuming effort. Here, we propose a method to construct complete saturation magnetization diagrams for Co–Fe–Ni alloys using scanning Hall probe microscopy (SHPM). A composition gradient was created by the diffusion multiple technique, generating a full combinatorial materials library with an identical thermal history. The composition and crystallographic phases of the alloys were identified by integrated energy dispersive X-ray spectroscopy and electron backscatter diffraction. “Pixel-by-pixel” perpendicular components of the magnetic field were converted into maps of saturation magnetization using the inversion matrix technique. The saturation magnetization dependence for the binary alloys was consistent with the Slater-Pauling behavior. By using a significantly denser data point distribution than previously available, the maximum of the Slater-Pauling curve for the Co–Fe alloys was identified at ~ 32 at% of Co. By mapping the entire ternary diagram of Co–Fe–Ni alloys recorded in a single experiment, we have demonstrated that SHPM—in concert with the combinatorial approach—is a powerful high-throughput characterization tool, providing an effective metrology platform to advance the search for new magnetic materials.
You have requested "on-the-fly" machine translation of selected content from our databases. This functionality is provided solely for your convenience and is in no way intended to replace human translation. Show full disclaimer
Neither ProQuest nor its licensors make any representations or warranties with respect to the translations. The translations are automatically generated "AS IS" and "AS AVAILABLE" and are not retained in our systems. PROQUEST AND ITS LICENSORS SPECIFICALLY DISCLAIM ANY AND ALL EXPRESS OR IMPLIED WARRANTIES, INCLUDING WITHOUT LIMITATION, ANY WARRANTIES FOR AVAILABILITY, ACCURACY, TIMELINESS, COMPLETENESS, NON-INFRINGMENT, MERCHANTABILITY OR FITNESS FOR A PARTICULAR PURPOSE. Your use of the translations is subject to all use restrictions contained in your Electronic Products License Agreement and by using the translation functionality you agree to forgo any and all claims against ProQuest or its licensors for your use of the translation functionality and any output derived there from. Hide full disclaimer
Details
1 Wayne State University, Department of Physics and Astronomy, Detroit, USA (GRID:grid.254444.7) (ISNI:0000 0001 1456 7807)
2 The Ohio State University, Department of Materials Science and Engineering, Columbus, USA (GRID:grid.261331.4) (ISNI:0000 0001 2285 7943)
3 Oxford Instruments America, Inc., Concord, USA (GRID:grid.261331.4); Carl Zeiss X-Ray Microscopy, Inc., Dublin, USA (GRID:grid.422866.c)
4 The Ohio State University, Department of Materials Science and Engineering, Columbus, USA (GRID:grid.261331.4) (ISNI:0000 0001 2285 7943); University of Maryland College Park, Department of Materials Science and Engineering, College Park, USA (GRID:grid.164295.d) (ISNI:0000 0001 0941 7177)