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Abstract
In NIO1, a compact H- ion source installed at RFX operated in continuous mode, gas conditioning was needed to improve results in Cs-free regimes (up to a current density about 25 or 30 A/m2). Installation of a cesium oven gave an additional increase of current, progressively limited also by a rapid overcesiation: we observed an average density about 50 A/m2 (with a peak of 67 A/m2). Obtained beam optics is briefly compared with simulations and previous results in the Cs-free regime in similar conditions (as source voltage, often set below or equal 11 kV). In both regimes, central beamlet apparent density is larger, possibly because of a narrow bias plate mask, now enlarged. Further improvements for Cs-based regime include a moderate oven reservoir temperature, careful tuning and a substantial increase of beam voltage, and power handling capability.
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Details
1 Consorzio RFX (CNR, ENEA, INFN, Universita di Padova, Acciaierie Venete SpA) , Cso Stati Uniti 4; 35127 Padua , IT
2 INFN-Laboratori Nazionali di Legnaro , Legnaro , IT
3 INFN-Sezione di Bari , Bari , IT
4 Consorzio RFX (CNR, ENEA, INFN, Universita di Padova, Acciaierie Venete SpA) , Cso Stati Uniti 4; 35127 Padua , IT; CNR-Istituto Scienza Tecnologia Plasmi , Milan, Padua, Bari , IT
5 INFN-Sezione di Bari , Bari , IT; CNR-Istituto Scienza Tecnologia Plasmi , Milan, Padua, Bari , IT