Full text

Turn on search term navigation

© 2022 by the authors. Licensee MDPI, Basel, Switzerland. This article is an open access article distributed under the terms and conditions of the Creative Commons Attribution (CC BY) license (https://creativecommons.org/licenses/by/4.0/). Notwithstanding the ProQuest Terms and Conditions, you may use this content in accordance with the terms of the License.

Abstract

The valence band photoemission (VB PE) spectra of the [Ni(Salen)] molecular complex were measured by ultraviolet, soft X-ray and resonant photoemission (ResPE) using photons with energies ranging from 21.2 eV to 860 eV. It was found that the Ni 3d atomic orbitals’ (AOs) contributions are most significant for molecular orbitals (MOs), which are responsible for the low-energy PE band at a binding energy of 3.8 eV in the VB PE spectra. In turn, the PE bands in the binding energies range of 8–16 eV are due to the photoionization of the MOs of the [Ni(Salen)] complex with dominant contributions from C 2p AOs. A detailed consideration was made for the ResPE spectra obtained using photons with absorption resonance energies in the Ni 2p3/2, N 1s, and O 1s Near-Edge X-ray Absorption Fine Structure (NEXAFS) spectra. A strong increase in the intensity of the PE band ab was found when using photons with an energy 854.4 eV in the Ni 2p3/2 NEXAFS spectrum. This finding is due to the high probability of the participator-Auger decay of the Ni 2p3/2−13d9 excitation and confirms the relationship between the PE band ab with the Ni 3d-derived MOs.

Details

Title
The Valence Band Structure of the [Ni(Salen)] Complex: An Ultraviolet, Soft X-ray and Resonant Photoemission Spectroscopy Study
Author
Korusenko, Petr M 1 ; Koroleva, Alexandra V 2   VIAFID ORCID Logo  ; Vereshchagin, Anatoliy A 3   VIAFID ORCID Logo  ; Sivkov, Danil V 4 ; Petrova, Olga V 4   VIAFID ORCID Logo  ; Levin, Oleg V 3   VIAFID ORCID Logo  ; Vinogradov, Alexander S 5   VIAFID ORCID Logo 

 Department of Solid State Electronics, St. Petersburg State University, 7/9 Universitetskaya nab., 199034 Saint Petersburg, Russia; [email protected] (D.V.S.); [email protected] (O.V.P.); [email protected] (A.S.V.); Department of Physics, Omsk State Technical University, 11 Mira prosp., 644050 Omsk, Russia 
 Resource Center “Physical Methods of Surface Investigation”, St. Petersburg State University, 7/9 Universitetskaya nab., 199034 Saint Petersburg, Russia; [email protected] 
 Department of Electrochemistry, Institute of Chemistry, St. Petersburg State University, 7/9 Universitetskaya nab., 199034 Saint Petersburg, Russia; [email protected] (A.A.V.); [email protected] (O.V.L.) 
 Department of Solid State Electronics, St. Petersburg State University, 7/9 Universitetskaya nab., 199034 Saint Petersburg, Russia; [email protected] (D.V.S.); [email protected] (O.V.P.); [email protected] (A.S.V.); Institute of Physics and Mathematics, Komi Science Centre, Ural Branch of the Russian Academy of Sciences, 167982 Syktyvkar, Russia 
 Department of Solid State Electronics, St. Petersburg State University, 7/9 Universitetskaya nab., 199034 Saint Petersburg, Russia; [email protected] (D.V.S.); [email protected] (O.V.P.); [email protected] (A.S.V.) 
First page
6207
Publication year
2022
Publication date
2022
Publisher
MDPI AG
ISSN
16616596
e-ISSN
14220067
Source type
Scholarly Journal
Language of publication
English
ProQuest document ID
2674361713
Copyright
© 2022 by the authors. Licensee MDPI, Basel, Switzerland. This article is an open access article distributed under the terms and conditions of the Creative Commons Attribution (CC BY) license (https://creativecommons.org/licenses/by/4.0/). Notwithstanding the ProQuest Terms and Conditions, you may use this content in accordance with the terms of the License.