Abstract

The roughness is an important parameter to evaluate the parts surface quality, so it is very important to measure the surface roughness of high-precision parts. In order to meet the needs of rapid and non-contact measurement of surface roughness, a new method based on optical scattering distribution is proposed in this paper. By analyzing the modulation effect of surface roughness on incident light, the relationship between surface roughness and scattering distribution is established. Based on the analysis of the characteristics of light source, detector and their relative position, the scattered light distribution measurement system is constructed. In the measurement system, the surface roughness is measured by real-time acquisition of scattering distribution. The roughness of different samples is measured by this method and white light interferometer, and the measurement standard deviation is less than 0.15nm. The measurement results show that this method is feasible and effective.

Details

Title
Research on Rapid Measurement Technology of Roughness Based on Light Scattering
Author
Wang, Hongjun 1 ; Chen, Wei 1 ; Liu Bingcai 1 ; Tian Ailing 1 

 Xi’an Technological University, Shanxi Province Key Laboratory of Thin Film Technology and Optical Test , Xi’an, 710021 , China 
First page
012024
Publication year
2022
Publication date
May 2022
Publisher
IOP Publishing
ISSN
17426588
e-ISSN
17426596
Source type
Scholarly Journal
Language of publication
English
ProQuest document ID
2690253015
Copyright
Published under licence by IOP Publishing Ltd. This work is published under http://creativecommons.org/licenses/by/3.0/ (the “License”). Notwithstanding the ProQuest Terms and Conditions, you may use this content in accordance with the terms of the License.