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Abstract
We present an ultracompact plasma-based method to measure spatial and temporal concurrence of intense electron and laser beams nonintrusively at their interaction point. The electron beam couples with a laser-generated seed plasma in dependence of spatiotemporal overlap, which triggers additional plasma production and manifests as enhanced plasma afterglow. This optical observable is exploited to measure beam concurrence with∼4μmspatial and∼26.7fstemporal accuracy, supported by auxiliary diagnostics. The afterglow interaction fingerprint is highly sensitive and enables ultraversatile femtosecond-micrometer beam metrology.
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