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© 2022 by the authors. Licensee MDPI, Basel, Switzerland. This article is an open access article distributed under the terms and conditions of the Creative Commons Attribution (CC BY) license (https://creativecommons.org/licenses/by/4.0/). Notwithstanding the ProQuest Terms and Conditions, you may use this content in accordance with the terms of the License.

Abstract

Cellulose crystallinity can be described according to the crystal size and the crystallinity index (CI). In this research, using Fourier-transform infrared spectroscopy (FTIR) and X-ray diffraction (XRD) methods, we studied the crystallinity of three different types of cellulose: banana rachis (BR), commercial cellulose (CS), and bacterial cellulose (BC). For each type of cellulose, we analyzed three different crystallization grades. These variations were obtained using three milling conditions: 6.5 h, 10 min, and unmilled (films). We developed a code in MATLAB software to perform deconvolution of the XRD data to estimate CI and full width at half-maximum (FWHM). For deconvolution, crystalline peaks were represented with Voigt functions, and a Fourier series fitted to the amorphous profile was used as the amorphous contribution, which allowed the contribution of the amorphous profile to be more effectively modeled. Comparisons based on the FTIR spectra and XRD results showed there were no compositional differences between the amorphous samples. However, changes associated with crystallinity were observed when the milling time was 10 min. The obtained CI (%) values show agreement with values reported in the literature and confirm the effectiveness of the method used in this work in predicting the crystallization aspects of cellulose samples.

Details

Title
Use of Fourier Series in X-ray Diffraction (XRD) Analysis and Fourier-Transform Infrared Spectroscopy (FTIR) for Estimation of Crystallinity in Cellulose from Different Sources
Author
Montoya-Escobar, Nicolás 1   VIAFID ORCID Logo  ; Ospina-Acero, Daniel 2 ; Jorge Andrés Velásquez-Cock 1 ; Gómez-Hoyos, Catalina 1   VIAFID ORCID Logo  ; Angélica Serpa Guerra 3 ; Piedad Felisinda Gañan Rojo 4   VIAFID ORCID Logo  ; Vélez Acosta, Lina Maria 3   VIAFID ORCID Logo  ; Juan Pablo Escobar 5 ; Correa-Hincapié, Natalia 6   VIAFID ORCID Logo  ; Triana-Chávez, Omar 7   VIAFID ORCID Logo  ; Robin Zuluaga Gallego 3   VIAFID ORCID Logo  ; Stefani, Pablo M 8   VIAFID ORCID Logo 

 Programa de Ingeniería en Nanotecnología, Universidad Pontificia Bolivariana, Circular 1_N_70-01, Medellín 050031, Colombia 
 Electro Science Laboratory, Department of Electrical and Computer Engineering, The Ohio State University, Columbus, OH 43210, USA 
 Facultad de Ingeniería Agroindustrial, Universidad Pontificia Bolivariana, Circular 1_N_70-01, Medellín 050031, Colombia 
 Facultad de Ingeniería Química, Universidad Pontificia Bolivariana, Circular 1_N_70-01, Medellín 050031, Colombia 
 Facultad de Ingeniería de Sistemas, Universidad Pontificia Bolivariana, Circular 1_N_70-01, Medellín 050031, Colombia 
 Grupo Calidad, Metrología y Producción, Instituto Tecnológico Metropolitano, Medellín 050013, Colombia 
 Grupo de Biología y Control de Enfermedades Infecciosas (BCEI), Sede de Investigación Universitaria, Universidad de Antioquia, Medellín 050010, Colombia 
 Instituto de Investigaciones en Ciencia y Tecnología de Materiales (INTEMA), Consejo Nacional de Investigaciones Científicas y Técnicas (CONICET), Universidad Nacional de Mar del Plata (UNMdP), Av. Colón 10850, Mar del Plata 7600, Argentina 
First page
5199
Publication year
2022
Publication date
2022
Publisher
MDPI AG
e-ISSN
20734360
Source type
Scholarly Journal
Language of publication
English
ProQuest document ID
2748554917
Copyright
© 2022 by the authors. Licensee MDPI, Basel, Switzerland. This article is an open access article distributed under the terms and conditions of the Creative Commons Attribution (CC BY) license (https://creativecommons.org/licenses/by/4.0/). Notwithstanding the ProQuest Terms and Conditions, you may use this content in accordance with the terms of the License.