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© 2023 by the authors. Licensee MDPI, Basel, Switzerland. This article is an open access article distributed under the terms and conditions of the Creative Commons Attribution (CC BY) license (https://creativecommons.org/licenses/by/4.0/). Notwithstanding the ProQuest Terms and Conditions, you may use this content in accordance with the terms of the License.

Abstract

Industrial defect detection plays an important role in smart manufacturing and is widely used in various scenarios such as smart inspection and product quality control. Currently, although utilizing a framework for knowledge distillation to identify industrial defects has achieved great progress, it is still a significant challenge task to extract better image features and prevent overfitting for student networks. In this study, a reverse knowledge distillation framework with two teachers is designed. First, for the teacher network, two teachers with different architectures are used to extract the diverse features of the images from multiple models. Second, considering the different contributions of channels and different teacher networks, the attention mechanism and iterative attention feature fusion idea are introduced. Finally, to prevent overfitting, the student network is designed with a network architecture that is inconsistent with the teacher network. Extensive experiments were conducted on Mvtec and BTAD datasets, which are industrial defect detection datasets. On the Mvtec dataset, the average accuracy values of image-level and pixel-level ROC achieved 99.43% and 97.87%, respectively. On the BTAD dataset, the average accuracy values of image-level and pixel-level ROC reached 94% and 98%, respectively. The performance on both datasets is significantly improved, demonstrating the effectiveness of our method.

Details

Title
Reverse Knowledge Distillation with Two Teachers for Industrial Defect Detection
Author
Mingjing Pei 1   VIAFID ORCID Logo  ; Liu, Ningzhong 2   VIAFID ORCID Logo  ; Gao, Pan 2 ; Sun, Han 2   VIAFID ORCID Logo 

 College of Computer Science and Technology, Nanjing University of Aeronautics and Astronautics, Nanjing 211106, China; [email protected] (M.P.); ; School of Electronics and Information Engineering, West Anhui University, Lu’an 237012, China; MIIT Key Laboratory of Pattern Analysis and Machine Intelligence, Nanjing 211106, China; Collaborative Innovation Center of Novel Software Technology and Industrialization, Nanjing 210093, China 
 College of Computer Science and Technology, Nanjing University of Aeronautics and Astronautics, Nanjing 211106, China; [email protected] (M.P.); ; MIIT Key Laboratory of Pattern Analysis and Machine Intelligence, Nanjing 211106, China; Collaborative Innovation Center of Novel Software Technology and Industrialization, Nanjing 210093, China 
First page
3838
Publication year
2023
Publication date
2023
Publisher
MDPI AG
e-ISSN
20763417
Source type
Scholarly Journal
Language of publication
English
ProQuest document ID
2791591349
Copyright
© 2023 by the authors. Licensee MDPI, Basel, Switzerland. This article is an open access article distributed under the terms and conditions of the Creative Commons Attribution (CC BY) license (https://creativecommons.org/licenses/by/4.0/). Notwithstanding the ProQuest Terms and Conditions, you may use this content in accordance with the terms of the License.