Full text

Turn on search term navigation

© 2023 by the authors. Licensee MDPI, Basel, Switzerland. This article is an open access article distributed under the terms and conditions of the Creative Commons Attribution (CC BY) license (https://creativecommons.org/licenses/by/4.0/). Notwithstanding the ProQuest Terms and Conditions, you may use this content in accordance with the terms of the License.

Abstract

Fault detection continues to be a relevant and ongoing topic in multiterminal High Voltage Direct Current (MT-HVDC) grid protection. In MT-HVDC grids, however, high DC-fault currents result from a failure of a complex protective threshold in traditional protection schemes, making Voltage Source Converter (VSC) vulnerable to such potent transient currents. In this innovative single-ended DC protection scheme, multiple time window segments are used to consider the effects of the transient period across limiting inductors at each end of the link. Multiple segments of 0–0.8, 0.8–1.5, and 1.5–3.0 ms reduce relay failure and improve the sensitivity to high fault impedance while requiring minimal computational effort. It employs feature extraction tools such as Stationary Wavelet Transform and Random Search (RS)-based Artificial Neural Networks (ANNs) for detecting transmission line faults within DC networks. Its goal is to improve the accuracy and reliability of protective relays as a result of various fault events. Simulations showed that the proposed algorithms could effectively identify any input data segment and detect DC transmission faults up to 500 ohms. Accuracy for the first segment is 100% for fault impedance up to 200 ohms, whereas the second and third segments show 100% accuracy for high impedance faults up to 400 ohms. In addition, they maintain 100% stability even under external disturbances.

Details

Title
Multisegmented Intelligent Solution for MT-HVDC Grid Protection
Author
Muhammad Zain Yousaf 1 ; Mirsaeidi, Sohrab 2   VIAFID ORCID Logo  ; Saqib Khalid 3   VIAFID ORCID Logo  ; Raza, Ali 4   VIAFID ORCID Logo  ; Chen Zhichu 1 ; Wasif Ur Rehman 5 ; Badshah, Fazal 1 

 School of Electrical and Information Engineering, Hubei University of Automotive Technology, Shiyan 442002, China; [email protected] (M.Z.Y.); [email protected] (C.Z.); 
 School of Electrical Engineering, Beijing Jiaotong University, Beijing 100044, China 
 School of Electrical Engineering, University of Lahore, Lahore 39161, Pakistan 
 School of Electrical Engineering, University of Engineering and Technology, Lahore 39161, Pakistan; [email protected] 
 School of Mathematics, Physics and Optoelectronic Engineering, Hubei University of Automotive Technology, Shiyan 442002, China 
First page
1766
Publication year
2023
Publication date
2023
Publisher
MDPI AG
e-ISSN
20799292
Source type
Scholarly Journal
Language of publication
English
ProQuest document ID
2806543096
Copyright
© 2023 by the authors. Licensee MDPI, Basel, Switzerland. This article is an open access article distributed under the terms and conditions of the Creative Commons Attribution (CC BY) license (https://creativecommons.org/licenses/by/4.0/). Notwithstanding the ProQuest Terms and Conditions, you may use this content in accordance with the terms of the License.