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Copyright: © 2022 Seifert R et al. This work is published under https://creativecommons.org/licenses/by/4.0/ (the “License”). Notwithstanding the ProQuest Terms and Conditions, you may use this content in accordance with the terms of the License.

Abstract

In correlative light and electron microscopy (CLEM), the fluorescent images must be registered to the EM images with high precision. Due to the different contrast of EM and fluorescence images, automated correlation-based alignment is not directly possible, and registration is often done by hand using a fluorescent stain, or semi-automatically with fiducial markers. We introduce “DeepCLEM”, a fully automated CLEM registration workflow. A convolutional neural network predicts the fluorescent signal from the EM images, which is then automatically registered to the experimentally measured chromatin signal from the sample using correlation-based alignment. The complete workflow is available as a Fiji plugin and could in principle be adapted for other imaging modalities as well as for 3D stacks.

Details

Title
DeepCLEM: automated registration for correlative light and electron microscopy using deep learning
Author
Seifert, Rick; Markert, Sebastian M; Britz, Sebastian; Perschin Veronika; Erbacher Christoph; Stigloher Christian; Kollmannsberger Philip
University/institution
U.S. National Institutes of Health/National Library of Medicine
Publication year
2022
Publication date
2022
Publisher
Faculty of 1000 Ltd.
e-ISSN
20461402
Source type
Scholarly Journal
Language of publication
English
ProQuest document ID
2844062077
Copyright
Copyright: © 2022 Seifert R et al. This work is published under https://creativecommons.org/licenses/by/4.0/ (the “License”). Notwithstanding the ProQuest Terms and Conditions, you may use this content in accordance with the terms of the License.