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© 2023 by the authors. Licensee MDPI, Basel, Switzerland. This article is an open access article distributed under the terms and conditions of the Creative Commons Attribution (CC BY) license (https://creativecommons.org/licenses/by/4.0/). Notwithstanding the ProQuest Terms and Conditions, you may use this content in accordance with the terms of the License.

Abstract

Visual measurement methods are extensively used in various fields, such as aerospace, biomedicine, agricultural production, and social life, owing to their advantages of high speed, high accuracy, and non-contact. However, traditional camera-based measurement systems, relying on the pinhole imaging model, face challenges in achieving three-dimensional measurements using a single camera by one shot. Moreover, traditional visual systems struggle to meet the requirements of high precision, efficiency, and compact size simultaneously. With the development of light field theory, the light field camera has garnered significant attention as a novel measurement method. Due to its special structure, the light field camera enables high-precision three-dimensional measurements with a single camera through only one shot. This paper presents a comprehensive overview of light field camera measurement technologies, including the imaging principles, calibration methods, reconstruction algorithms, and measurement applications. Additionally, we explored future research directions and the potential application prospects of the light field camera.

Details

Title
Measurement Technologies of Light Field Camera: An Overview
Author
Hu, Xiaoming 1   VIAFID ORCID Logo  ; Li, Zhuotong 2   VIAFID ORCID Logo  ; Li, Miao 2   VIAFID ORCID Logo  ; Fang, Fengzhou 2   VIAFID ORCID Logo  ; Jiang, Zhongjie 3   VIAFID ORCID Logo  ; Zhang, Xiaodong 2 

 State Key Laboratory of Precision Measuring Technology & Instruments, Laboratory of MicroNano Manufacturing Technology, Tianjin University, Tianjin 300072, China; [email protected] (X.H.); [email protected] (Z.L.); [email protected] (L.M.); [email protected] (F.F.); Beijing Jumper Science Ltd., Beijing 100036, China; [email protected] 
 State Key Laboratory of Precision Measuring Technology & Instruments, Laboratory of MicroNano Manufacturing Technology, Tianjin University, Tianjin 300072, China; [email protected] (X.H.); [email protected] (Z.L.); [email protected] (L.M.); [email protected] (F.F.) 
 Beijing Jumper Science Ltd., Beijing 100036, China; [email protected] 
First page
6812
Publication year
2023
Publication date
2023
Publisher
MDPI AG
e-ISSN
14248220
Source type
Scholarly Journal
Language of publication
English
ProQuest document ID
2849100143
Copyright
© 2023 by the authors. Licensee MDPI, Basel, Switzerland. This article is an open access article distributed under the terms and conditions of the Creative Commons Attribution (CC BY) license (https://creativecommons.org/licenses/by/4.0/). Notwithstanding the ProQuest Terms and Conditions, you may use this content in accordance with the terms of the License.