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© 2023 by the authors. Licensee MDPI, Basel, Switzerland. This article is an open access article distributed under the terms and conditions of the Creative Commons Attribution (CC BY) license (https://creativecommons.org/licenses/by/4.0/). Notwithstanding the ProQuest Terms and Conditions, you may use this content in accordance with the terms of the License.

Abstract

Infrared thermography (IRT) is a technique used to diagnose Photovoltaic (PV) installations to detect sub-optimal conditions. The increase of PV installations in smart cities has generated the search for technology that improves the use of IRT, which requires irradiance conditions to be greater than 700 W/m2, making it impossible to use at times when irradiance goes under that value. This project presents an IoT platform working on artificial intelligence (AI) which automatically detects hot spots in PV modules by analyzing the temperature differentials between modules exposed to irradiances greater than 300 W/m2. For this purpose, two AI (Deep learning and machine learning) were trained and tested in a real PV installation where hot spots were induced. The system was able to detect hot spots with a sensitivity of 0.995 and an accuracy of 0.923 under dirty, short-circuited, and partially shaded conditions. This project differs from others because it proposes an alternative to facilitate the implementation of diagnostics with IRT and evaluates the real temperatures of PV modules, which represents a potential economic saving for PV installation managers and inspectors.

Details

Title
IoT System Based on Artificial Intelligence for Hot Spot Detection in Photovoltaic Modules for a Wide Range of Irradiances
Author
Cardinale-Villalobos, Leonardo 1   VIAFID ORCID Logo  ; Jimenez-Delgado, Efren 2   VIAFID ORCID Logo  ; García-Ramírez, Yariel 1   VIAFID ORCID Logo  ; Araya-Solano, Luis 3   VIAFID ORCID Logo  ; Solís-García, Luis Antonio 1   VIAFID ORCID Logo  ; Méndez-Porras, Abel 2   VIAFID ORCID Logo  ; Alfaro-Velasco, Jorge 2   VIAFID ORCID Logo 

 School of Electronic Engineering, Costa Rica Institute of Technology, Cartago 159-7050, Costa Rica 
 School of Computer Engineering, Costa Rica Institute of Technology, Cartago 159-7050, Costa Rica 
 School of Physics, Costa Rica Institute of Technology, Cartago 159-7050, Costa Rica 
First page
6749
Publication year
2023
Publication date
2023
Publisher
MDPI AG
e-ISSN
14248220
Source type
Scholarly Journal
Language of publication
English
ProQuest document ID
2849134695
Copyright
© 2023 by the authors. Licensee MDPI, Basel, Switzerland. This article is an open access article distributed under the terms and conditions of the Creative Commons Attribution (CC BY) license (https://creativecommons.org/licenses/by/4.0/). Notwithstanding the ProQuest Terms and Conditions, you may use this content in accordance with the terms of the License.