Abstract

We present a hybrid quantum-classical variational scheme to enhance precision in quantum metrology. In the scheme, both the initial state and the measurement basis in the quantum part are parameterized and optimized via the classical part. It enables the maximization of information gained about the measured quantity. We discuss specific applications to 3D magnetic field sensing under several dephasing noise models. Indeed, we demonstrate its ability to simultaneously estimate all parameters and surpass the standard quantum limit, making it a powerful tool for metrological applications.

Details

Title
Variational quantum metrology for multiparameter estimation under dephasing noise
Author
Le, Trung Kien 1 ; Nguyen, Hung Q. 2 ; Ho, Le Bin 3 

 University of California, Santa Barbara, Department of Physics, Santa Barbara, USA (GRID:grid.133342.4) (ISNI:0000 0004 1936 9676); Stanford University, Department of Applied Physics, Stanford, USA (GRID:grid.168010.e) (ISNI:0000 0004 1936 8956) 
 Vietnam National University, Nano and Energy Center, University of Science, Hanoi, Vietnam (GRID:grid.267852.c) (ISNI:0000 0004 0637 2083) 
 Tohoku University, Frontier Research Institute for Interdisciplinary Sciences, Sendai, Japan (GRID:grid.69566.3a) (ISNI:0000 0001 2248 6943); Tohoku University, Department of Applied Physics, Graduate School of Engineering, Sendai, Japan (GRID:grid.69566.3a) (ISNI:0000 0001 2248 6943) 
Pages
17775
Publication year
2023
Publication date
2023
Publisher
Nature Publishing Group
e-ISSN
20452322
Source type
Scholarly Journal
Language of publication
English
ProQuest document ID
2878563631
Copyright
© The Author(s) 2023. This work is published under http://creativecommons.org/licenses/by/4.0/ (the “License”). Notwithstanding the ProQuest Terms and Conditions, you may use this content in accordance with the terms of the License.