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© 2023 by the authors. Licensee MDPI, Basel, Switzerland. This article is an open access article distributed under the terms and conditions of the Creative Commons Attribution (CC BY) license (https://creativecommons.org/licenses/by/4.0/). Notwithstanding the ProQuest Terms and Conditions, you may use this content in accordance with the terms of the License.

Abstract

Faults in solar photovoltaic (PV) modules often result from component damage, leading to voltage fluctuations and decreased stability in the power system. In this study, the original voltage signals of different PV modules show little variation. Therefore, a solution that combines symmetrized dot pattern (SDP) and AlexNet for fault detection in PV modules was proposed. This solution investigates three common faults: poor welding, cracking, and bypass diode failure, which can be applied to fault-free modules. First, a high-frequency signal was input into the PV module, and the raw signal was captured using an NI PXI-5105 high-speed data acquisition card. Next, we used SDP to process the signal and create images with specific snowflake-like features. These images were used as a basis for fault diagnosis. Finally, deep-learning algorithms were used to perform status detection on the PV module. This research also used 3200 training samples and 800 test samples (200 for each type) to evaluate a new method for diagnosing faults in PV modules. The results show that the accuracy of the new method reached 99.8%, surpassing traditional convolutional neural networks (CNN) and extension neural networks (ENN), whose accuracies were 99.5% and 91.75%, respectively. Furthermore, this study compares the proposed method with more traditional numerical fault diagnosis methods. SDP effectively extracts fault signals and presents them as images. With AlexNet used for fault identification, the method excels in accuracy, training time, and testing time, thereby enhancing the stability and reliability of future energy systems.

Details

Title
Fault Diagnosis for PV Modules Based on AlexNet and Symmetrized Dot Pattern
Author
Meng-Hui, Wang 1   VIAFID ORCID Logo  ; Chun-Chun, Hung 2 ; Shiue-Der Lu 1   VIAFID ORCID Logo  ; Zong-Han, Lin 1 ; Cheng-Chien, Kuo 2   VIAFID ORCID Logo 

 Department of Electrical Engineering, National Chin-Yi University of Technology, Taichung 411, Taiwan; [email protected] (M.-H.W.); [email protected] (Z.-H.L.) 
 Department of Electrical Engineering, National Taiwan University of Science and Technology, Taipei 106, Taiwan; [email protected] (C.-C.H.); [email protected] (C.-C.K.) 
First page
7563
Publication year
2023
Publication date
2023
Publisher
MDPI AG
e-ISSN
19961073
Source type
Scholarly Journal
Language of publication
English
ProQuest document ID
2893048867
Copyright
© 2023 by the authors. Licensee MDPI, Basel, Switzerland. This article is an open access article distributed under the terms and conditions of the Creative Commons Attribution (CC BY) license (https://creativecommons.org/licenses/by/4.0/). Notwithstanding the ProQuest Terms and Conditions, you may use this content in accordance with the terms of the License.