Full text

Turn on search term navigation

© 2023 by the authors. Licensee MDPI, Basel, Switzerland. This article is an open access article distributed under the terms and conditions of the Creative Commons Attribution (CC BY) license (https://creativecommons.org/licenses/by/4.0/). Notwithstanding the ProQuest Terms and Conditions, you may use this content in accordance with the terms of the License.

Abstract

In blueberry farming, accurately assessing maturity is critical to efficient harvesting. Deep Learning solutions, which are increasingly popular in this area, often undergo evaluation through metrics like mean average precision (mAP). However, these metrics may only partially capture the actual performance of the models, especially in settings with limited resources like those in agricultural drones or robots. To address this, our study evaluates Deep Learning models, such as YOLOv7, RT-DETR, and Mask-RCNN, for detecting and classifying blueberries. We perform these evaluations on both powerful computers and embedded systems. Using Type-Influence Detector Error (TIDE) analysis, we closely examine the accuracy of these models. Our research reveals that partial occlusions commonly cause errors, and optimizing these models for embedded devices can increase their speed without losing precision. This work improves the understanding of object detection models for blueberry detection and maturity estimation.

Details

Title
Comprehensive Analysis of Model Errors in Blueberry Detection and Maturity Classification: Identifying Limitations and Proposing Future Improvements in Agricultural Monitoring
Author
Aguilera, Cristhian A 1   VIAFID ORCID Logo  ; Figueroa-Flores, Carola 2   VIAFID ORCID Logo  ; Aguilera, Cristhian 3 ; Navarrete, Cesar 3 

 Facultad de Ingeniería, Arquitectura y Diseño, Universidad San Sebastián, Lago Panguipulli 1390, Puerto Montt 5501842, Chile 
 Departamento de Ciencias de la Computación y Tecnologías de la Información, Facultad de Ciencias Empresariales, Universidad del Bío-Bío, Chillan 3800708, Chile; [email protected] 
 Departamento de Ingeniería Eléctrica y Electrónica, Facultad de Ingeniería, Universidad del Bío-Bío, Concepción 4051381, Chile; [email protected] (C.A.); [email protected] (C.N.) 
First page
18
Publication year
2024
Publication date
2024
Publisher
MDPI AG
e-ISSN
20770472
Source type
Scholarly Journal
Language of publication
English
ProQuest document ID
2918504849
Copyright
© 2023 by the authors. Licensee MDPI, Basel, Switzerland. This article is an open access article distributed under the terms and conditions of the Creative Commons Attribution (CC BY) license (https://creativecommons.org/licenses/by/4.0/). Notwithstanding the ProQuest Terms and Conditions, you may use this content in accordance with the terms of the License.