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Copyright © 2024 R. Mukesh et al. This is an open access article distributed under the Creative Commons Attribution License (the “License”), which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited. Notwithstanding the ProQuest Terms and Conditions, you may use this content in accordance with the terms of the License. https://creativecommons.org/licenses/by/4.0/

Abstract

This paper presents forecast and investigation of the variation in ionospheric Total Electron Content (TEC) during the solar eclipses (SEs) of December 2019 and June 2020 using three different methods: Deep Autoregressive model (DeepAR), Feed-Forward Neural Network (FFNN), and Ordinary Kriging-based Surrogate Model (OKSM), and the TEC data predicted by DeepAR, FFNN, and OKSM were compared with the actual TEC during the observation days. The study was conducted based on GPS data taken from the IISC receiver located in Bangalore, India, during the SEs which happened on 26.12.2019 and 21.06.2020. The TEC data were examined to assess the effect of solar eclipses on TEC values. Eighty-day prior TEC data for the IISC station are gathered from IONOLAB servers along with the other parameter data like Dst, Ap, F10.7, and Kp taken from OMNIWEB servers which were used to predict TEC. The reliability of the forecasted results is evaluated using numerical factors like Normalized Root Mean Square Error (NRMSE), Correlation Coefficient (CC), Root Mean Square Error (RMSE), Mean Absolute Error (MAE), and R-squared. The study demonstrates the usefulness of combining multiple methods for analyzing TEC variations during SEs and highlights the potential of OKSM, FFNN, and DeepAR models for studying TEC variation in the same context. The findings may be useful for satellite broadcasting and navigational services and for further research into the influence of solar eclipses on the TEC changes.

Details

Title
Forecasting Ionospheric TEC Changes Associated with the December 2019 and June 2020 Solar Eclipses: A Comparative Analysis of OKSM, FFNN, and DeepAR Models
Author
Mukesh, R 1   VIAFID ORCID Logo  ; Dass, Sarat C 2   VIAFID ORCID Logo  ; Negash Lemma Gurmu 3   VIAFID ORCID Logo  ; Vijay, M 1   VIAFID ORCID Logo  ; Kiruthiga, S 4   VIAFID ORCID Logo  ; Mythili, S 5   VIAFID ORCID Logo  ; Ratnam, D Venkata 6   VIAFID ORCID Logo  ; V B S Srilatha Indira Dutt 7   VIAFID ORCID Logo 

 Department of Aerospace Engineering, ACS College of Engineering, Bangalore, India 
 School of Mathematical & Computer Sciences, Heriot-Watt University Malaysia, Putrajaya, Malaysia 
 Department of Industrial Engineering, Ambo University, Ambo, Oromia, Ethiopia 
 Department of ECE, Saranathan College of Engineering, Trichy, India 
 Department of ECE, PSNA College of Engineering and Technology, Dindigul, India 
 Department of ECE, KL University, Guntur, Andhra Pradesh, India 
 Department of EECE, GITAM School of Technology, Visakhapatnam, India 
Editor
Fernando Aguado Agelet
Publication year
2024
Publication date
2024
Publisher
John Wiley & Sons, Inc.
ISSN
16877969
e-ISSN
16877977
Source type
Scholarly Journal
Language of publication
English
ProQuest document ID
3020593989
Copyright
Copyright © 2024 R. Mukesh et al. This is an open access article distributed under the Creative Commons Attribution License (the “License”), which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited. Notwithstanding the ProQuest Terms and Conditions, you may use this content in accordance with the terms of the License. https://creativecommons.org/licenses/by/4.0/