Abstract

One of the most promising routes toward scalable quantum computing is a modular approach. We show that distinct surface code patches can be connected in a fault-tolerant manner even in the presence of substantial noise along their connecting interface. We quantify analytically and numerically the combined effect of errors across the interface and bulk. We show that the system can tolerate 14 times higher noise at the interface compared to the bulk, with only a small effect on the code’s threshold and subthreshold behavior, reaching threshold with ~1% bulk errors and ~10% interface errors. This implies that fault-tolerant scaling of error-corrected modular devices is within reach using existing technology.

Details

Title
Fault-tolerant connection of error-corrected qubits with noisy links
Author
Ramette, Joshua 1   VIAFID ORCID Logo  ; Sinclair, Josiah 1 ; Breuckmann, Nikolas P. 2 ; Vuletić, Vladan 1   VIAFID ORCID Logo 

 Massachusetts Institute of Technology, Department of Physics, MIT-Harvard Center for Ultracold Atoms and Research Laboratory of Electronics, Cambridge, USA (GRID:grid.116068.8) (ISNI:0000 0001 2341 2786) 
 University of Bristol, School of Mathematics, Bristol, UK (GRID:grid.5337.2) (ISNI:0000 0004 1936 7603) 
Pages
58
Publication year
2024
Publication date
2024
Publisher
Nature Publishing Group
e-ISSN
20566387
Source type
Scholarly Journal
Language of publication
English
ProQuest document ID
3066165070
Copyright
© The Author(s) 2024. This work is published under http://creativecommons.org/licenses/by/4.0/ (the “License”). Notwithstanding the ProQuest Terms and Conditions, you may use this content in accordance with the terms of the License.