Abstract
An improved method for identifying sporadic E (Es) layer properties from radio occultation (RO) electron density profiles (EDPs) is presented. The data used are sourced from COSMIC-1 RO EDPs collected between 2006 and 2019, which cover altitudes from 75 to 145 km. Initially, we evaluate the reliability of EDPs using the International Reference Ionosphere 2016 (IRI-2016) model and select only those profiles with a reliability score of 0.6 or higher (on a scale up to 1) for further analysis. Preliminary Es layer inversion results are obtained and validated against electron density data derived from ionosonde fbEs measurements, demonstrating a linear correlation with a coefficient of 0.72 and a mean absolute percentage error of 36.08%. Further verification using RO S4max data shows that this research method achieved an accuracy of 85.3% in identifying Es events. We perform a detailed analysis of Es layer relative occurrence rates, intensity, and thickness. The Es intensity is expressed by NmμEs (the layer’s maximum electron density (Nm) corresponding to the metal (μ) ion), which is estimated from the measured layer peak electron density NmEs by subtracting the ambient E region electron density NeE(hEs) at the height of the layer’s peak hEs, computed from the IRI-2016 model. Our findings reveal that Es layers predominantly occur in mid-latitude regions during summer, with average intensities between
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Details
; Luo, Jia 3 ; Hu, Tianyang 1 1 Wuhan University, School of Geodesy and Geomatics, Wuhan, China (GRID:grid.49470.3e) (ISNI:0000 0001 2331 6153)
2 Wuhan University, School of Geodesy and Geomatics, Wuhan, China (GRID:grid.49470.3e) (ISNI:0000 0001 2331 6153); Collaborative Innovation Center for Geospatial Technology, Wuhan, China (GRID:grid.459426.8) (ISNI:0000 0001 2170 761X)
3 Wuhan University, School of Geodesy and Geomatics, Wuhan, China (GRID:grid.49470.3e) (ISNI:0000 0001 2331 6153); China Key Laboratory of Geospace Environment and Geodesy, Ministry of Education, Wuhan, China (GRID:grid.419897.a) (ISNI:0000 0004 0369 313X)




