Abstract

Dispersion spectroscopy based on frequency measurement of the high finesse optical cavity mode shifts induced by the presence of a gas medium with absorption resonances is an attractive alternative to standard absorptive spectroscopy. The main advantage of such pure frequency-based dispersive spectroscopy technique is the unique combination of sensitivity and accuracy. High sensitivity is ensured by high finesse optical cavities providing extremely long effective optical paths. On the other hand, high accuracy is provided by frequency measurement cavity mode shift. This makes this technique free from systematic errors coming from the non-linearity of light intensity measurements, which is one of the limiting factors in typical absorptive spectroscopy. We review several realizations of dispersive spectroscopy in high finesse optical cavities from Doppler-free to broadband. These techniques are especially useful for studying weak molecular transitions applicable in testing fundamental physics, gas metrology, spectroscopic thermometry, and a new generation of spectroscopic databases.

Details

Title
Pure frequency-based dispersive spectroscopy
Author
Cygan, A 1 ; Bielska, K 1 ; Charczun, D 1 ; Kowzan, G 1 ; Nishiyama, A 2 ; Wcisło, P 1 ; Wójtewicz, S 1 ; Zaborowski, M 1 ; Masłowski, P 1 ; Lisak, D 1 ; Ciuryło, R 1 ; Fleisher, A J 3 ; Gillis, K A 4 ; Hodges, J T 3 ; Voumard, T 5 ; Wilidi, T 5 ; Herr, T 6 ; Brasch, V 7 

 Institute of Physics, Faculty of Physics, Astronomy and Informatics, Nicolaus Copernicus University in Toruń , ul. Grudziądzka 5, 87-100 Toruń, Poland 
 Institute of Physics, Faculty of Physics, Astronomy and Informatics, Nicolaus Copernicus University in Toruń , ul. Grudziądzka 5, 87-100 Toruń, Poland; National Metrology Institute of Japan (NMIJ) , National Institute of Advanced Industrial Science and Technology, 1-1-1 Umezono, Tsukuba, Ibaraki 305-8563, Japan 
 Chemical Sciences Division, National Institute of Standards and Technology , 100 Bureau Drive, Gaithersburg, MD 20899, USA 
 Sensor Science Division, National Institute of Standards and Technology , 100 Bureau Drive, Gaithersburg, MD 20899, USA 
 Deutsches Elektronen-Synchrotron DESY , Notkestr. 85, 22607 Hamburg, Germany 
 Deutsches Elektronen-Synchrotron DESY , Notkestr. 85, 22607 Hamburg, Germany; Physics Department, Universität Hamburg UHH , Luruper Chaussee 149, 22761 Hamburg, Germany 
 CSEM - Swiss Center for Electronics and Microtechnology , 2000 Neuchâtel, Switzerland 
First page
012061
Publication year
2024
Publication date
Nov 2024
Publisher
IOP Publishing
ISSN
17426588
e-ISSN
17426596
Source type
Scholarly Journal
Language of publication
English
ProQuest document ID
3131844867
Copyright
Published under licence by IOP Publishing Ltd. This work is published under https://creativecommons.org/licenses/by/4.0/ (the “License”). Notwithstanding the ProQuest Terms and Conditions, you may use this content in accordance with the terms of the License.